Deep and narrow structures
For structures with a high depth-to-width ratio, the geometry of the AFM tip can be decisive for reliable imaging.
Our high-aspect-ratio probes are designed for such demanding surface structures.
AFM probes for demanding applications
Dr. J Consulting offers selected AFM probes for research and industrial applications.
Our particular focus is on high-aspect-ratio AFM probes with a conical tip. These probes are especially interesting for applications in which deep, narrow or complex structured surfaces are to be examined precisely.
Conical tip with a high aspect ratioSuited to demanding applications with deep and narrow structures.Applications
Complex surface structures
For samples with heavily structured or hard-to-reach surfaces, a conical tip can offer advantages in imaging.
Micro- and nanostructures
For examining small structures and fine surface features we offer probes for various AFM applications.
Demanding measurement tasks
Depending on the measurement mode, the sample and the information required, different probe properties can be decisive. We support you in finding a probe suited to your specific application.
Our focus: high aspect ratio
Compared with many conventional pyramidal AFM tips, our probes have a conical tip geometry with a high aspect ratio.
This makes them particularly interesting for applications in which conventional probe geometries can reach their limits.
Which probe suits your application?
Choosing a suitable AFM probe depends on the sample, the measurement mode and the imaging requirements.
Tell us about your application, your AFM system and the key requirements. Together with you we will assess which probe could be suitable.